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Zeiss 1450 VP scanning electron microscope
eagle-i ID
http://harvard.eagle-i.net/i/0000012e-2527-7826-b2b9-4d8780000000
Resource Type
Properties
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Resource Description
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"Features:
1. Integrated Inca300/SEM Si(Li) X-ray detector and X-ray
2. INCA and ISIS analysis systems
3. Leo-32 image analysis system"
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Additional Name
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Zeiss 1450 VP SEM
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Contact
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Godleski, John, M.D.
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Manufacturer
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Carl Zeiss, Inc.
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Model Number
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1450 VP
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Website(s)
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https://apps.sph.harvard.edu/publisher/upload/research/niehs/facility-cores/electron-microscopy-facility/index.html
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Related Technique
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Scanning electron microscopy
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Location
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0000012e-357a-187b-550e-f59280000000
