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Zeiss 1450 VP scanning electron microscope

eagle-i ID

http://harvard.eagle-i.net/i/0000012e-2527-7826-b2b9-4d8780000000

Resource Type

  1. Scanning electron microscope

Properties

  1. Resource Description
    "Features: 1. Integrated Inca300/SEM Si(Li) X-ray detector and X-ray 2. INCA and ISIS analysis systems 3. Leo-32 image analysis system"
  2. Additional Name
    Zeiss 1450 VP SEM
  3. Contact
    Godleski, John, M.D.
  4. Manufacturer
    Carl Zeiss, Inc.
  5. Model Number
    1450 VP
  6. Website(s)
    https://apps.sph.harvard.edu/publisher/upload/research/niehs/facility-cores/electron-microscopy-facility/index.html
  7. Related Technique
    Scanning electron microscopy
  8. Location
    0000012e-357a-187b-550e-f59280000000
 
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Provenance Metadata About This Resource Record

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